Microscopic film measurement and non-transparent sample film thickness measurement are also possible! Non-contact film thickness gauge.
It is also possible to dock with your existing microscope! By combining the microscope film measurement with the 2D spectral radiation option, detailed measurements of the in-plane film thickness distribution are also possible.
FF8" measures the reflectance of samples (interference waveforms) and enables non-contact multi-point thickness measurement through the analysis of thickness values using methods such as FFT (Fast Fourier Transform thickness gauge) and curve fitting thickness gauges. In addition to thickness measurement, it can also measure the thickness and refractive index of films and glass, and with optional features, it can perform multilayer film analysis, curve fitting methods, microscopy, mapping measurements, color measurements, and component concentration analysis. Options also include microscopic film measurement and thickness measurement of non-transparent samples. In microscopic film measurement, it uses a microscope to reduce the measurement spot size, allowing for thickness measurement in fine areas, such as RGB patterns of color filters or wiring patterns on substrates, which are difficult to measure macroscopically. For non-transparent sample measurement, it calculates the thickness of non-transparent samples by measuring the thickness of the air layer. Typically, measurement methods using light interference cannot measure the thickness of non-transparent samples, but this measurement method makes it possible. *For more details, please refer to the PDF document or feel free to contact us.
- Company：システムロード
- Price：Other
